IEC61032 Test Probe Kits BND-TPK06
Model:BND-TPK06
Product Details
· BND-B: IEC Jointed Finger Probe w/ banana jack in handle (as required)
· BND-19: Child Test Finger Probe / Probe 19 of IEC 61032
· BND-18: Child Test Finger Probe / Probe 18 of IEC 61032
· BND-13: Test Pin Probe (short)
· BND-12: Test Pin Probe
· BND-D: 1.0mm Test Wire Probe / Test Probe D of IEC 61032
· BND-C: 2.5mm Test Rod Probe / Test Probe C of IEC 61032
· BND-11: Rigid Finger Probe
· BND-SG: IEC Test Hook (with means for connection to force gauge)
· BND-G500R: 50mm impact test ball w/ removable eyelet (as required)
· BND-G227: Impact Test Ball w/ Rockwell Hardness R62+ (as required)
· BND-TB12: Telecom Test Probe (to test accessibility to TNV circuits)
· CC-04: Two padded carrying cases
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